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Selective MBE Growth of InGaAs Quantum Wire-Dot Coupled Structures with Controlled Double-Barrier Potential Profiles

机译:具有受控双屏障电位型材的InGaAs量子线耦合结构的选择性MBE成长

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Selective MBE growth of InGaAs quantum wire-dot (QWR-QD) coupled structures was investigated in view of application to large-scale integration of single electron transistors. A particular attention was paid to establish growth conditions for precisely controlling the double-barrier potential profiles. The minimum barrier width of 85 nm and the maximum barrier height of 140 meV were achieved in a controlled fashion. The effective sizes of the InGaAs QWRs and QDs were also controlled by the growth conditions and could be reduced down to a few 10 nm range.
机译:考虑到应用于单电子晶体管的大规模集成,研究了IngaAs量子线点(QWR-QD)耦合结构的选择性MBE的生长。特别注意建立用于精确控制双屏障潜在型材的生长条件。以受控的方式实现85nm的最小阻挡宽度和140mev的最大阻挡高度。 InGaAs QWR和QD的有效尺寸也由生长条件控制,并且可以减少到几个10nm范围内。

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