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Open circuit voltage and loss mechanisms in polycrstalline Cu(InGa)Se{sub}2-heterodiodes from photoluminescence studies

机译:从光致发光研究中的多晶Cu(Inga)Se {亚} 2-异丙二双过氧的开路电压和损耗机制

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We have analyzed Cu(InGa)Se{sub}2 heterodiodes and film sequences by room temperature absolute photo-luminescence measurements using the regime of AM1.5 equivalent generation rates. The samples investigated include heterodiodes as well as film sequences composed of absorber layers, window layers and contacts as they occur in the conventional process of cell production. We consider illuminated cells and layers as spectrally selective black bodies and evaluate the splitting of the quasi-Fermi levels via Planck's generalized law. The magnitude of the quasi Fermi level splitting can be used to predict the maximum achievable open circuit voltage in the devices. We see a strong influence of the interfaces at the back contact and the window layers on the luminescence signal. We quantity the effect of the interfaces on the maximum achievable open-circuit voltage. Finally we compare the predicted maximum open-circuit voltage with direct electrical measurements on the same devices.
机译:通过使用AM1.5等同产生速率的制度,通过室温绝对光发光测量分析Cu(Inga)Se {Sea {Sea} 2异二烃和胶片序列。研究的样品包括异源二极管以及由吸收层,窗口层和触点组成的膜序列,因为它们发生在细胞产生的常规过程中。我们认为照明的细胞和层作为光谱选择性黑色体,并通过Planck的广义法律评估准费米水平的分裂。准fermi水平分离的幅度可用于预测设备中的最大可实现的开路电压。我们会看到接触界面的强烈影响和发光信号上的窗口层。我们数量接口对最大可实现的开路电压的影响。最后,我们将预测的最大开路电压与同一设备上的直接电测量进行了比较。

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