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Correction techniques for Fourier transform spectrometer measurements of short infrared pulses

机译:用于短红外脉冲的傅立叶变换光谱仪测量的校正技术

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The acquisition of an interferogram by a Fourier transform spectrometer takes a finite time and the source being measured must not vary during the acquisition. Even with a fast scanning spectrometer it can happen that the source of interest vary during the acquisition. We were faced with this problem when we wanted to measure the spectrum of gun flashes. In this paper we present interferogram correction techniques that we developed to handle this problem. Using the fact that small-arms flashes are reproducible, we either measured or estimated these times of occurrence. Then, after properly filtering the original interferograms, we constructed a new set of interferograms, by piecing together parts of different filtered interferograms, to obtain instantaneous interferograms for various times during the flash. We show the utility of having a good estimate of the flash total intensity as a function of time, as estimated from the interferomgrams ZPD values or by measurements with a radiometer, to correct fro amplitude variations. Even with such a small set of interferograms, the application of these correction techniques allows good measurements of the temporal evolution of the spectral emission of short pulses, such as gun flashes in the infrared region between 2 and 5 microns.
机译:通过傅里叶变换光谱仪采集干涉图采用有限时间,并且在采集期间,所测量的源不得变化。即使有快速扫描光谱仪,也可能发生感兴趣的来源在采集期间变化。当我们想测量枪闪光的光谱时,我们面临着这个问题。在本文中,我们提出了我们开发的干扰图校正技术,以处理这个问题。使用小臂闪光是可重复的事实,我们要么衡量或估计这些发生的时间。然后,在适当地过滤原始干扰图之后,我们通过拼接不同滤波干扰图的部分构建了一组新的干涉图,以在闪光期间获得瞬时干扰图。我们展示了与时间ZPD值的时间估计的函数的闪光总强度良好估计的效用,或者通过用辐射计测量来校正幅度变化。即使使用这么一小一组干涉图,这些校正技术的应用允许良好地测量短脉冲的光谱发射的时间演变,例如在2到5微米之间的红外区域中的枪闪烁。

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