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Strategies for the Analysis of Single Unit Failures in Low Failure Rate Applications

机译:低故障率应用中单个单元故障分析的策略

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Many manufacturers in the microelectronics industry supply customers who increasingly demand ultra-low product failure rates. However, one of the least desirable scenarios for the microelectronic failure analyst is when analysis is required on a single failed unit. In these cases, the analyst loses the luxury of having "disposable" failing units in the analysis process. In the following discussion we present strategies to help the analyst more effectively find the failure mechanism for single unit failures.
机译:许多厂商在微电子行业供应客户越来越多的产品故障率。然而,微电子故障分析师的最不理想的场景之一是在单个故障单元上需要分析时。在这些情况下,分析师失去了在分析过程中具有“一次性”失败单位的奢侈品。在下面的讨论中,我们提出了帮助分析师更有效地找到单个单元故障的故障机制的策略。

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