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Strategies for the Analysis of Single Unit Failures in Low Failure Rate Applications

机译:低故障率应用中单机故障的分析策略

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摘要

Many manufacturers in the microelectronics industry supply customers who increasingly demand ultra-low product failure rates. However, one of the least desirable scenarios for the microelectronic failure analyst is when analysis is required on a single failed unit. In these cases, the analyst loses the luxury of having "disposable" failing units in the analysis process. In the following discussion we present strategies to help the analyst more effectively find the failure mechanism for single unit failures.
机译:微电子行业中的许多制造商都为越来越需要超低产品故障率的客户提供服务。但是,微电子故障分析器最不希望出现的情况之一是何时需要对单个故障单元进行分析。在这些情况下,分析人员失去了在分析过程中拥有“一次性”失效单元的奢侈。在下面的讨论中,我们提出了一些策略来帮助分析人员更有效地找到单个单元故障的故障机制。

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