Spectroellipsometric characterization of multilayer systems containing Ni and Bi

摘要

In this paper an optical evaluation of the system Ni,Bi/Cu,ITO/glass system, prepared by electrochimical method is presented. Among various factors that affect the optical and structural properties of the multistructure systems we focus on the influence of the substrate and the interfacial oxidic layers. To this end we used the Spectroellipsometric (SE) method in VIS-NIR spectral range. The SE results show that the electrochemical deposited films (Ni,Bi) are porous and their refractive index depends strongly on the substrate.