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Revisiting VLSI interconnects in deep sub-micron: some open questions

机译:重新审视Deep Sim-Micron中的VLSI互连:一些打开的问题

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Deep sub-micron technology has increased the design complexity of VLSI circuits. Design of routers now has to take care of the timing issues for faster design convergence. This has yielded wider scope of research in design and performance of interconnects. We focus on certain critical aspects of interconnects, and related open research issues. The discussions are on (i) the fidelity of delay estimators, and its use in finding global routing trees, (ii) a new class of routing trees, and (in) the evolution of new metric for interconnect performance measurement.
机译:深次微米技术提高了VLSI电路的设计复杂性。路由器的设计现在必须照顾更快的设计融合的时间问题。这在互连的设计和性能方面产生了更广泛的研究范围。我们专注于互连的某些关键方面,以及相关的开放研究问题。讨论是(i)延迟估计器的保真度,以及在寻找全球路由树,(ii)一类新的路由树木,(IN)对互连性能测量的新度量的演变。

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