Test application time reduction for scan based sequential circuits

摘要

This paper addresses the issue of reducing test application time in sequential circuits with partial scan using a single clock configuration without freezing the state of the non-scan flip-flops. Experimental results show that this technique significantly reduces test application time. Further, we study the effect of ordering the scan flip-flops on the test vector length and also present a non-atomic two-clock scan method which can be easily incorporated in conventional test generation environment.