A New Approach of Dielectric Permittivity Investigation of Crystalline and Nanocomposite Materials at SubTerahertz Frequency Range

摘要

In this paper, we have discussed a new approach for measuring the dielectric permittivity of crystalline and nanocomposite materials at subTHz frequency range. The proposed approach's idea is based on the interferometric method, where the shifts in the interference fringes are received by introducing the wedge from the epoxy risen in one arm of the interferometer. All the measuring processes are controlled by means of the LabVIEW programming language. The proposed method was experimentally verified on the Fused Silica and BK-7 glasses. The received values of dielectric permittivity are in good agreement with the one from the literature.