Research on reliability assessment of space electronic products based on integration of highly accelerated life test and accelerated degradation test

摘要

Space electronic products usually should meet the mission requirements of long life and low cost. Because of insufficient failure data, it is hard to assess the reliability precisely by using traditional reliability testing and statistical method. In this paper, a method of reliability assessment based on integration of highly accelerated life testing (HALT) and accelerated degradation testing (ADT) is proposed. Firstly, based on performance analysis of electronic products, the degradation of performance is modeled. Moreover, the data of drift performance is extracted, fitted and fused into the observation data in ADT. Lastly, the reliability assessment for electronic products is studied based on degradation data. This research provides an effective way for accelerated reliability testing of space electronic products, and it has been applied into practice.