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Laser production and product qualification via accelerated life testing based on statistical modeling
Laser production and product qualification via accelerated life testing based on statistical modeling
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机译:通过基于统计模型的加速寿命测试进行激光生产和产品鉴定
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摘要
A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures (220) and wafer qualification (225) are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
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