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Low Temperature Plasma Etching of Copper, Silver and Gold Films

机译:铜,银和金膜的低温等离子体刻蚀

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摘要

Copper, silver and gold films possess unique electrical and optical properties that render them suitable for various device structures as employed in integrated circuits and plasmonic devices. Traditional etching of these metal films in halogenated plasmas is difficult due to the low vapor pressure of halogenated metal species. Reasonable etch rates of Cu, Ag, and Au films are obtained with hydrogen-based plasmas. Pattern formation with hydrogen and methane plasmas yields excellent selectivity to barrier materials such as Ta and Ti and generates metal wall slopes of ~80°.
机译:铜,银和金膜具有独特的电学和光学特性,使其适合集成电路和等离子器件中采用的各种器件结构。由于卤化金属物质的蒸汽压低,因此很难在卤化等离子体中对这些金属膜进行传统蚀刻。用氢基等离子体可获得合理的Cu,Ag和Au膜蚀刻速率。用氢和甲烷等离子形成图形对阻挡材料(例如Ta和Ti)具有出色的选择性,并产生约80°的金属壁斜率。

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