首页> 外文会议>Indium Phosphide and Related Materials, 1995. Conference Proceedings., Seventh International Conference on >Electrical properties of the hydrogen defect in InP and the microscopic structure of the 2316 cm/sup -1/ hydrogen related line
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Electrical properties of the hydrogen defect in InP and the microscopic structure of the 2316 cm/sup -1/ hydrogen related line

机译:InP中氢缺陷的电学性质和2316 cm / sup -1 /氢相关谱线的微观结构

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We have shown that in H/sub 2/-D/sub 2/ codoped InP samples a splitting of the 2315.6 cm/sup -1/ hydrogen related local vibrational mode is observed. This provides further evidence for the assignment of this line to a fully hydrogenated indium vacancy. Based on a simple argument we suggest that this defect shows electrical activity as a donor in agreement with previously reported results. We observe that this defect is lost during annealing under P-overpressure which has been shown to result in semi-insulating material. We suggest that the loss of intrinsic donors is due to the reduction of the VH/sub 4/ defect associated with the 2315.6 cm/sup -1/ line.
机译:我们已经表明,在H / sub 2 / -D / sub 2 /共掺杂的InP样品中,观察到2315.6 cm / sup -1 /氢相关的局部振动模式的分裂。这为将该生产线分配给完全氢化的铟空位提供了进一步的证据。基于一个简单的论点,我们建议该缺陷显示出作为供体的电活动,与先前报道的结果一致。我们观察到,该缺陷在P超压下的退火过程中消失了,这已表明会导致半绝缘材料。我们建议,固有供体的损失是由于与2315.6 cm / sup -1 /线相关的VH / sub 4 /缺陷的减少。

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