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Research on Fast Change Temperature TCU in IC Manufacturing

机译:IC制造中快速变化温度TCU的研究

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摘要

Temperature fast change during a step or several steps is required by latest etching process in IC manufacturing. Two methods to reach this requirement was described, and several simulation devices are designed to test the capability. The temperature control unit (TCU) need to provide two different channels coolant with high and low temperature. One method is to switch the different channels connect to main tool electrostatic chuck (ESC). Two different base temperatures can be used for main tool, the heater in the ESC is controlled to get the final temperature. Another is to mix the two different temperatures with motor valves to reach the target temperature. Two types of equipment are developed using the corresponding method. The test devices are introduced, and the test shows transient temperature response of two equipment. Both channels must return to their respective set points with ±1°C variation within 120 seconds. The maximum deviation of supply temperature must below 20°C when temperature ramp up or ramp down. These TCU can support the latest etching process and the switch or mix test with simulation devices can be used to judge the TCU performance.
机译:在IC制造中的最新蚀刻工艺需要在步骤或几个步骤期间进行温度快速变化。描述了两种达到该要求的方法,并且若干模拟设备旨在测试该能力。温度控制单元(TCU)需要提供具有高温和低温的两个不同的通道冷却剂。一种方法是切换连接到主刀具静电卡盘(ESC)的不同通道。两个不同的基础温度可用于主工具,控制ESC中的加热器以获得最终温度。另一种是将两个不同的温度与电动机阀混合到达目标温度。使用相应的方法开发了两种类型的设备。介绍测试装置,测试显示了两个设备的瞬态温度响应。这两个通道必须在120秒内返回其各自的设定点,在120秒内变化±1°C。温度升高或斜坡时,供应温度的最大偏差必须低于20°C。这些TCU可以支持最新的蚀刻过程,并且可以使用带仿真设备的开关或混合测试来判断TCU性能。

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