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Supply-Chain Security Enhancement by Chaotic Wireless Chip-Package-Board Interactive PUF

机译:混沌无线芯片封装板交互式PUF增强了供应链的安全性

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This paper presents a novel assembly-circuit boundary solution for semiconductor supply-chain security enhancement. Chip-Package-Board (CPB) interactive PUF is introduced to incorporates a history of CPB process/assembly variations into a device PUF ID generation. An incremental update of PUF ID through the supply chain extends the device ID traceability for tackling against malicious counterfeiting at not only chip fabrication but also package/board assembly steps. A wireless connectivity through inductive coupling of an on-chip coil is utilized for the interaction between a PUF circuit and package/board materials. No any additional fabrication or assembly processes are needed as the on-chip coil can be formed by using existing on-chip interconnect resources. A coupled chaos oscillator is employed as the PUF core for a good synergistic usage with the wireless connectivity at a high-frequency RF signaling regime. An inherent parametric sensitivity of chaos exhibits the ID uniqueness and unclonability stemmed from the CPB process/assembly static variations. This sensitivity however makes PUF to be susceptible to the dynamic disturbances in voltage and temperature. Associated instability is suppressed by an analog replica-based feedback compensation circuit with digital post-processing to guarantee the ID reproducibility. The proposed interactive PUF concept is successfully demonstrated with prototype measurement using a 0.18um CMOS test chip in a simple Chip-on-Board (CoB) assembly.
机译:本文提出了一种新颖的装配电路边界解决方案,用于增强半导体供应链的安全性。引入了芯片封装板(CPB)交互式PUF,以将CPB的工艺/装配变化的历史结合到设备PUF ID生成中。通过供应链对PUF ID进行的增量更新扩展了设备ID的可追溯性,从而不仅可以在芯片制造过程中而且可以在封装/电路板组装步骤中应对恶意伪造。通过片上线圈的电感耦合实现的无线连接可用于PUF电路与封装/板材料之间的相互作用。不需要任何额外的制造或组装过程,因为可以通过使用现有的片上互连资源来形成片上线圈。耦合混沌振荡器被用作PUF内核,可与高频RF信令机制下的无线连接良好地协同使用。混沌的固有参数敏感性表现出源自CPB过程/组件静态变化的ID唯一性和不可克隆性。但是,这种敏感性使PUF容易受到电压和温度的动态干扰。带有数字后处理的基于模拟副本的反馈补偿电路可抑制相关的不稳定性,以保证ID的可再现性。所提议的交互式PUF概念已通过在简单的板上芯片(CoB)组件中使用0.18um CMOS测试芯片进行原型测量而得以成功演示。

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