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Development of high performance synchronous rectifier module by multi-chip Cu sintering technology (IMPACT 2018)

机译:通过多芯片Cu烧结技术开发高性能同步整流器模块(IMPACT 2018)

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In Recent year, the traditional Si and wide band-gap power semiconductor devices, particularly Si MOSFET, Si IGBT, SiC MOSFET and GaN E-HEMT have gained considerable attention in several industrial applications such as the hybrid electric vehicle, the internet data center and aero-space applications. Attachment of power semiconductor devices to an insulated metal carrier substrate is essential for providing electrical and structural connections as well as a heat dissipation path. The die attach materials play a vital role in ensuring the system performance and reliability. In this study, the key technologies including multi-chip Cu paste sintering and panel level packaging have been developed. With an optimized process condition, a voidless die attaching joint was gained, and the die shear strength was as high as 70 MPa as sintering. Furthermore, the reduction of thermal resistance was measured by using Cu sintering, and the electrical performance of the newly developed Synchronous Rectifier was fully reported in this study.
机译:近年来,传统的Si和宽带隙功率半导体器件,特别是Si MOSFET,Si IGBT,SiC MOSFET和GaN E-HEMT,在混合动力汽车,互联网数据中心和半导体等多种工业应用中引起了相当大的关注。航空航天应用。将功率半导体器件连接到绝缘的金属载体基板上对于提供电气和结构连接以及散热路径至关重要。管芯附着材料在确保系统性能和可靠性方面起着至关重要的作用。在这项研究中,已开发了包括多芯片铜浆烧结和面板级封装在内的关键技术。在优化的工艺条件下,获得了无空隙的模具连接接头,并且模具剪切强度与烧结一样高,高达70 MPa。此外,通过使用Cu烧结测量了热阻的降低,并且在这项研究中充分报道了新开发的同步整流器的电性能。

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