Successful module hot spot testing of 120 ppma carbon contaminated silicon feedstock

摘要

Several options for solar grade silicon feedstock have been investigated over the years to bring down the costs of silicon wafers. Generally the resulting silicon contains higher levels of impurities, the level depending on the refining processes. In this work wafers from a p-type mc-Si ingot made with feedstock contaminated with 120 ppma of carbon have been processed firstly into solar cells and secondly into 60-cell solar modules. The focus here is to study the module reliability. It was demonstrated that a hot spot endurance test could be passed without any problems.