Modeling RTL fault models behavior to increase the confidence on TSIM-based fault injection

摘要

Future high-performance safety-relevant applications require microcontrollers delivering higher performance than the existing certified ones. However, means for assessing their dependability are needed so that they can be certified against safety critical certification standars (e.g ISO26262). Dependability assessment analyses performed at high level of abstraction inject single faults to investigate the effects these have in the system. In this work we show that single faults do not comprise the whole picture, due to fault multiplicities and reactivations. Later we prove that, by injecting complex fault models that consider multiplicities and reactivations in higher levels of abstraction, results are substantially different, thus indicating that a change in the methodology is needed.