首页> 外文会议>International Semiconductor Conference >Formation of a double electric layer at the Zn{sub}mIn{sub}2S{sub}(m+3) (m = 1,2,3)-H{sub}2O(S{sup}(2-)/S{sub}2{sup}(2-)) interface
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Formation of a double electric layer at the Zn{sub}mIn{sub}2S{sub}(m+3) (m = 1,2,3)-H{sub}2O(S{sup}(2-)/S{sub}2{sup}(2-)) interface

机译:在zn {sub} min {sub} 2s {sub}(m + 3)(m = 1,2,3)-h {sub} 2o(s {sup}(2 - )/)处形成双电层(m = 1,2,3)/ s {sub} 2 {sup}(2-))接口

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The attempt to explain the mechanism of electric double layer formation at electrolyte H{sub}2O(S{sup}2/S{sub}2{sup}2) interface with photoelectrode based on ternary semiconductor compounds ZnIn{sub}2S{sub}4 is the purpose of this work. Space charge layer in the semiconductor having thickness L{sub}D = 10{sup}(-3) cm and electrostatic field value at interface electrolyte/semiconductor E≈10{sup}4 V/cm was calculated.
机译:试图用基于三元半导体化合物的电解质H {Sub} 2o(s {sup} 2 / s {sub} 2)与光电电极的电力双层形成机制与光电电极Znin {sub} 2s {sub 4是这项工作的目的。计算具有厚度L {Sub} D = 10 {sup}( - 3)cm的空间电荷层,并计算接口电解质/半导体E×4V / cm处的静电场值。

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