A low-power scan driver using depletion-mode amorphous indium-gallium-zinc-oxide thin-film transistors for high-resolution active-matrix liquid-crystal displays

摘要

A low-power scan driver using depletion-mode amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) is proposed to integrate on 10-inch wide quad extended graphics array (WQXGA, 1600 × 2560) active-matrix liquid-crystal displays (AMLCDs). The proposed scan driver uses clock signals with a reduced voltage swing for lower power consumption. In addition, the proposed scan driver uses ten a-IGZO TFTs, one capacitor and five external signals per stage to achieve the simple structure. In comparison with the state-of-the-art, 24.2% of power consumption is reduced. The power consumption of the proposed scan driver of ten stages is 460.2 µW at the output voltage swing of 30 V and the operating frequency of 153.6 kHz.