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Research on Dead Time of Half-Bridge LLC Resonant Circuit Based on SiC MOSFET

机译:基于SiC MOSFET的半桥LLC谐振电路死区时间研究

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As the third generation semiconductor with wide band gap, SiC MOSFET not only has fast switching speed and better switching characteristics, but also has certain efficiency in the converter. LLC resonant converter has been widely concerned as an efficient DC-DC converter. SiC MOSFET is used as the primary side switch of half-bridge LLC resonant converter to further improve the efficiency of the converter. Zero voltage switching can reduce the loss and improve the efficiency of half-bridge LLC resonant converter. This paper analyzes the influence of dead time on zero voltage turn-on, and calculates the critical dead time. The switching performance of SiC MOSFET was tested by setting up a dual-pulse experimental platform. By setting up a half-bridge LLC resonant converter, different dead time was set for comparative experiments. The experimental results show that the dead time is too large to achieve zero voltage switching.
机译:作为具有宽带隙的第三代半导体,SiC MOSFET不仅具有快速的开关速度和更好的切换特性,而且在转换器中也具有一定的效率。 LLC谐振转换器已被广泛关注为高效的DC-DC转换器。 SIC MOSFET用作半桥LLC谐振转换器的初级侧开关,以进一步提高转换器的效率。 零电压切换可以降低损耗并提高半桥LLC谐振转换器的效率。 本文分析了死区时间对零电压开启的影响,并计算了关键的死区时间。 通过设置双脉冲实验平台来测试SiC MOSFET的开关性能。 通过设置半桥LLC谐振转换器,为比较实验设定不同的死区时间。 实验结果表明,死区时间太大而无法实现零电压切换。

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