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RELIABILITY ANALYSIS OF THE ESS TARGET SAFETY SYSTEM

机译:ESS目标安全系统的可靠性分析

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The European Spallation Source (ESS) will be a 5 MW neutron spallation research facility where an energetic proton beam incident upon a helium-cooled tungsten target is converted to neutron beams, see [1] for more detail. The Target Safety System (TSS) is part of the overall radiation safety plan for the ESS Target Station. As such, in case of an abnormal event, the TSS will protect the public from exposure to unsafe levels of radiation, prevent the release of radioactive material beyond permissible limits, and bring the neutron spallation function into a safe state. The TSS is a safety interlock system consisting of two redundant trains, one based on relays and the other based on safety PLCs. The radiation safety functions for the ESS target were derived from the hazard and accident analyses of target station systems and areas. By analyzing the accident scenarios quantitatively, the radiation dose consequences to the public were determined. The dose consequences combined with the probability of occurrence identifies the level of risk for each event, and defines the appropriate risk reduction required for the TSS Safety Instrumented Functions (SIF) in order to achieve a tolerable level of risk. Analysis of the hardware reliability of the TSS will be presented. This is identified as the safety integrity level (SIL), and describes the Probability of Failure on Demand (PFD) of each SIF, including input devices, logic modules, and final element devices. The results from the SIL verification illustrate that based on the current architecture the TSS SIFs meet the SIL target.
机译:欧洲散裂源(ESS)将是一个5兆瓦中子散裂研究设施,其中高能质子束入射到一个氦冷却钨靶被转换为中子射线,见[1]对于更多的细节。目标安全系统(TSS)是ESS目标站的整体辐射安全计划的一部分。因此,在异常事件的情况下,TSS将保护暴露于辐射的不安全水平的市民,防止放射性物质的释放超出了允许的范围,并把散裂中子功能进入安全状态。该TSS是由两个冗余列车的基础上,继电器和一个基于安全PLC其他的安全联锁系统。为ESS目标的辐射的安全功能,从目标基站系统和区域的危险和事故分析而得。通过定量分析事故情况,辐射剂量的后果向公众进行了测定。剂量后果与发生识别的概率为每个事件的风险等级组合,并且以达到风险的容忍的水平定义了TSS安全仪表功能(SIF)所需的适当的风险降低。的TSS的硬件可靠性分析将提交。这被确定为安全完整性等级(SIL),并且描述了点播(PFD)失败的概率每个SIF,包括输入设备,逻辑模块和最终元件的设备。从SIL验证的结果说明,基于当前的体系结构中的应力强度因子TSS满足SIL目标。

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