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SOLDER JOINT RELIABILITY OF DIFFERENT EGAs REWORKED USING LOW MELTING POINT LEAD FREE ALLOYS

机译:低熔点无铅合金加工的不同EGA的焊点可靠性

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BGA packages with SAC (Sn-Ag-Cu) 385 balls were assembled on Printed Circuit Board (PCB) test vehicles using no clean SAC 385 paste. These components were then reworked using a new low temperature lead-free rework process.In this process, a solder alloy with a melting range lower than that of SAC solder was used. The lower process temperature introduces less risk of heat damage to both the reworked and adjacent components and well as to the board (cratering and board warpage).The microstructure of the resulting mixed solder joints when SAC 385 balls were assembled using low melt paste was examined "as assembled" as well as after "accelerated thermal cycling" (ATC) using optical and scanning electron microscopy methods.ATC study was performed in a temperature range of 0-100°C following IPC-9701 specification [1] to 6000 cycles. Previous work had reported thermal fatigue reliability results up to 2500 cycles [2].Ddifferent surface finishes including Immersion Silver (ImmAg) and Electroless Nickel/Immersion Gold (ENIG) were used on these assembly test vehicles. The low melt rework process was performed on 0.093" and 0.125" thick boards and was done in nitrogen atmosphere.It has been observed that independent of component type, thermal fatigue life of SAC BGA components reworked using Lower melting point alloys may be comparable or slightly better than that of the components reworked using conventional SAC 385.
机译:使用SAC(Sn-Ag-Cu)385球的BGA封装使用干净的SAC 385焊膏组装在印刷电路板(PCB)测试车上。然后使用新的低温无铅返工工艺对这些组件进行返工。 在此过程中,使用了熔点范围比SAC焊料低的焊料合金。较低的工艺温度对返工的零件和相邻的零件以及电路板的热损坏风险较小(缩孔和电路板翘曲)。 当使用低熔点糊剂组装SAC 385球时,以及使用光学和扫描电子显微镜方法在“加速热循环”(ATC)之后,都检查了所得混合焊点的微观结构。 根据IPC-9701规范[1]至6000个循环,在0-100°C的温度范围内进行了ATC研究。先前的工作报告了高达2500个循环的热疲劳可靠性结果[2]。 在这些组装测试车上使用了不同的表面光洁度,包括浸银(ImmAg)和化学镍/浸金(ENIG)。低熔返工过程是在0.093“和0.125”厚板上进行的,并且是在氮气气氛下进行的。 已经观察到,与部件类型无关,使用低熔点合金重新加工的SAC BGA部件的热疲劳寿命可能与使用常规SAC 385重新加工的部件相当或稍好。

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