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Overcoming wireload model uncertainty during physical design

机译:在物理设计期间克服Wireload模型不确定性

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The advent of deep sub-micron technologies has created a number of problems for existing design methodologies. Most prominent among them is the problem of timing closure, whereby design time is dramatically increased due to iterations between gate-level synthesis and physical design. It is well known that the heart of this problem lies in the use of wireload models based on wirelength statistics from legacy designs. Some technology projections in have suggested that wireload models will remain effective to block sizes on the order of 50k gates. This suggests that synthesis will not have to be changed much since this is approximately the maximum size for which logic synthesis is effective. However, our analyses on production designs show that the problem is not quite so straightforward, and the efficacy of synthesis using wireload models depends upon technology data as well as specific characteristics of the design. We analyze these effects and dependencies in detail in this paper, and draw someconclusions about the amount of physical information that is required for synthesis to be effective. Finally, we discuss the implications on hierarchical design flows, and propose a solution via physical prototyping.

机译:>深层微米技术的出现为现有设计方法创造了许多问题。其中最突出的是定时闭合问题,由此由于栅极级合成和物理设计之间的迭代而导致设计时间显着增加。众所周知,这个问题的核心在于使用基于Legacy Designs的Wirelight Statistics的Wireload模型。有些技术预测建议Wireload模型将在50k门的顺序阻挡大小。这表明,合成不必改变很大,因为这大约是逻辑合成是有效的最大尺寸。然而,我们对生产设计的分析表明,问题不太简单,并且使用Wireload模型的合成功效取决于技术数据以及设计的特定特性。我们在本文中详细分析了这些效果和依赖性,并在合成有效所需的物理信息量的情况下绘制一些物理信息。最后,我们讨论了对等级设计流的影响,并通过物理原型提出了解决方案。

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