Department of Electrical Engineering Computer Engineering, George Mason University, Fairfax, VA 22030 CMOS and Novel Devices Group, Semiconductor Electron Division, NIST, Gaithersburg, MD 20899;
Department of Electrical Engineering Computer Engineering, Old Dominion University, Norfolk, VA 23529 and The Applied Research Center-ODU-Jefferson Lab, Newport News, VA 23606;
Department of Electrical Engineering Computer Engineering, George Mason University, Fairfax, VA 22030 CMOS and Novel Devices Group, Semiconductor Electron Division, NIST, Gaithersburg, MD 20899;
Department of Electrical Engineering Computer Engineering, Old Dominion University, Norfolk, VA 23529 and The Applied Research Center-ODU-Jefferson Lab, Newport News, VA 23606;
Department of Electrical Engineering Computer Engi;
机译:Aluminum氧化铝作为SONOS型非易失性存储器中电荷存储和氧化阻挡层的高速运行
机译:用于非易失性存储器的纳米晶氧化锌嵌入锆掺杂的氧化ha高k电介质的电荷去俘获和介电击穿
机译:用于非易失性存储器的纳米晶氧化锌嵌入锆掺杂的氧化ha高k电介质的电荷去俘获和介电击穿
机译:ALD高k介电膜在非易失性存储器中的电荷存储层和阻塞氧化物
机译:用于非易失性电荷存储存储设备的铂纳米粒子和高k电介质的原子层沉积。
机译:非易失性存储应用中的扫描探针显微镜技术对掺杂铜的氧化锌薄膜中的陷获电荷进行电学研究
机译:用NH3氮化GdO作为非易失性存储器应用的电荷存储层改善存储特性