首页> 外文会议>JAERI-Conf 2005-003; Symposium on Nuclear Data; 20041111-12; Tokai(JP) >A New Technique to Measure Double-differential Charged-particle Emission Cross Sections Using Pencil-beam DT Neutrons
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A New Technique to Measure Double-differential Charged-particle Emission Cross Sections Using Pencil-beam DT Neutrons

机译:使用笔形束DT中子测量双微分带电粒子发射截面的新技术

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摘要

For precise measurement of Double-differential Charged-particle Emission Cross Section(DDXc), a unique technique was developed. Utilizing an anticoincidence spectrum successfully extended lower limit of measurable energy for α-particle. The validity of the present technique was confirmed from the result that the obtained total cross section agreed with the evaluated value of ~(27)Al(n,xα) reactions. The measurements for beryllium were carried out. The results suggested more detailed analysis for ~9Be(n, charged particle) reactions was required.
机译:为了精确测量双微分带电粒子发射横截面(DDXc),开发了一种独特的技术。利用反符合光谱成功地扩展了α粒子可测量能量的下限。结果表明,所获得的总横截面与〜(27)Al(n,xα)反应的评估值相符,从而证实了本技术的有效性。进行铍的测量。结果表明需要对〜9Be(n,带电粒子)反应进行更详细的分析。

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