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Electronic Conductivity in Nanocrystalline Ce_(0.9)Gd_(0.1)O_(1.95)Thin Films at High Oxygen Partial Pressures

机译:高氧分压下纳米Ce_(0.9)Gd_(0.1)O_(1.95)薄膜的电导率

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Gadolinium doped cerium oxide (Ce_(0.9)Gd_(0.1)O_(1.95)) thin films with different microstructure (epitaxial vs. nanocrystalline) were investigated by impedance spectroscopy in oxidizing conditions. As expected, with increasing grain boundary density the ionic conductivity decreased significantly. In addition to this, the sample with the smallest average grain size (10 nm) exhibited a remarkable electronic conductivity (25% of the total conductivity) at an oxygen partial pressure of 10~(-5) bar and temperature of 280℃ despite the large dopant content. This at first surprising result can be fully explained in the framework of the space charge model.
机译:在氧化条件下,通过阻抗谱研究了具有不同微观结构(外延与纳米晶)的掺do氧化铈(Ce_(0.9)Gd_(0.1)O_(1.95))薄膜。如预期的那样,随着晶界密度的增加,离子电导率显着下降。除此之外,在氧分压为10〜(-5)bar和温度为280℃的条件下,平均晶粒尺寸最小(10 nm)的样品仍具有出色的电子电导率(占总电导率的25%)。大量的掺杂物。起初令人惊讶的结果可以在空间电荷模型的框架中得到充分解释。

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