首页> 外文会议>International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces Mar 11-14, 2001 Chateau Elan, Braselton, Georgia >Shear Property and Microstructure Evaluation of Pb-free Solder Bumps under Room Temperature and Multiple Reflow/High Temperature Aging
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Shear Property and Microstructure Evaluation of Pb-free Solder Bumps under Room Temperature and Multiple Reflow/High Temperature Aging

机译:室温和多次回流/高温时效下无铅焊锡块的剪切性能和显微组织评估

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Environmental concerns surrounding the use of Pb in the semiconductor industry have led to the need for a Pb-free solution for solder materials. Tin-rich solder alloys are the most commonly studied Pb-free solders for a variety of solder joining applications. In this study, bump shear and microstructure evaluations have been performed to characterize Sn-3.5Ag, Sn-3.8Ag-0.7Cu, Sn-0.7Cu, and along with eutectic Sn-37Pb. Bump shear strengths were monitored during room temperature aging up to 1000 hrs, and during the high temperature storage at 125, 150, and 170℃ up to 1000 hrs after two and 10 reflows. All bump shear failures were through the solder, indicating that the interfaces of the bump structure all have good adhesion. The different shear strength was observed with respect to solder alloy composition. At room temperature, the shear strength of eutectic Sn-37Pb decreased by 25% after 51 days aging after reflow while the shear strength of all the Pb-free alloys decreased slightly by 5 - 8%. Microstructure evolution with aging time was observed and correlated to shear strength change at room temperature. The shear strength of both Sn-3.5Ag and Sn-3.8Ag-0.7Cu solders became lower after two reflows but were not affected up to 10 reflows. The shear strength of Sn-37Pb and Sn-0.7Cu solder had no change after either multiple reflows or high temperature storage. The solder bump microstructure at these conditions was characterized. Chemical reactions between solders and under bump metallurgy (UBM) interactions during multiple reflows and high temperature storage were also investigated. The Sn-37Pb solder consumed less Cu UBM than all other Pb-free solders during reflow. However, it consumed more Cu after solid state annealing. An optimal Pb-free alloy (Sn-0.7Cu) is proposed based on this study, and previously reported mechanical property and thermal fatigue reliability evaluations for flip chip solder joints.
机译:围绕半导体行业中使用Pb的环境问题,导致需要一种用于焊料材料的无Pb解决方案。富锡焊料合金是最广泛研究的无铅焊料,适用于各种焊料连接应用。在这项研究中,进行了颠簸剪切和微观结构评估,以表征Sn-3.5Ag,Sn-3.8Ag-0.7Cu,Sn-0.7Cu以及共晶Sn-37Pb。在两次和10次回流后,在室温老化至多1000小时以及在125、150和170℃的高温储存过程中,直至1000小时,都监测了凸点剪切强度。所有凸块剪切破坏都是通过焊料造成的,这表明凸块结构的界面都具有良好的附着力。对于焊料合金组成,观察到不同的剪切强度。在室温下,回流后51天时效后,共晶Sn-37Pb的剪切强度下降了25%,而所有无铅合金的剪切强度则下降了5%至8%。观察到随着时间的推移微观结构的演变,并与室温下的剪切强度变化相关。两次回流后,Sn-3.5Ag和Sn-3.8Ag-0.7Cu焊料的剪切强度均降低,但在10次回流后均未受到影响。多次回流或高温保存后,Sn-37Pb和Sn-0.7Cu焊料的剪切强度没有变化。在这些条件下对焊料凸点的微观结构进行了表征。还研究了多次回流和高温存储期间焊料之间的化学反应以及凸块冶金学(UBM)相互作用。在回流期间,Sn-37Pb焊料消耗的铜UBM低于所有其他无铅焊料。但是,固态退火后消耗了更多的铜。在此研究的基础上,提出了一种最佳的无铅合金(Sn-0.7Cu),并先前报道了倒装芯片焊点的机械性能和热疲劳可靠性评估。

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