Faculty of Physics, Taras Shevchenko Kyiv National University, Kyiv 01601, Ukraine;
Faculty of Physics, Taras Shevchenko Kyiv National University, Kyiv 01601, Ukraine;
Department of Electronic Properties of Materials, Faculty of Physics, University of Vienna, A-1090 Wien, Austria;
Department of Electronic Properties of Materials, Faculty of Physics, University of Vienna, A-1090 Wien, Austria;
silicon; surface photovoltage; surface cleaning; ultrasonic cavitation;
机译:超声清洗对单晶硅载流子寿命和光电压的影响
机译:表面纹理化对单晶硅太阳能电池少数型载流子寿命和光伏性能的影响
机译:碱性溶液诱导刻蚀对单晶硅光学和少数载流子寿命特征的影响
机译:超声波清洁对单晶硅载流子寿命和光电电压的影响
机译:载流子寿命测量,用于表征超净p / p +硅外延薄层。
机译:制备工艺和退火处理对硅纳米线薄膜少数载流子寿命的影响
机译:表面光电少数载体寿命分析定量分析硅中硅污染
机译:加工对硅太阳电池载流子寿命的影响