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Phase assignment for bright field of dense contact

机译:密集接触的明场的相位分配

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摘要

There is a simple algorithm to translate the dense contacts of a regular design into a well assigned two phases in this paper. Some of its basic variant applications and a procedure to detect the phase assignment errors for the whole chip layer to insure the whole chip phase assignment success are also included. The variant applications include to add the assist features and assign the phases between the main features and the assist features and the post rule bias consideration. This executable environment makes the alternating PSM easy to be applied in the bright field of the dense contact.
机译:有一种简单的算法可以将常规设计的密集触点转换为分配良好的两个阶段。还包括其一些基本的变体应用和检测整个芯片层的相位分配错误以确保整个芯片相位分配成功的过程。变体应用程序包括添加辅助功能,并在主要功能和辅助功能之间分配阶段,并考虑规则后偏差。这种可执行的环境使交替的PSM易于应用于密集触点的明场中。

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