首页> 外文会议>Conference on Micromachining and Microfabrication Process Technology IX; Jan 27-29, 2004; San Jose, California, USA >Original technology applied for manufacturing a cantilever-type piezo-resistive micro-accelerometer
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Original technology applied for manufacturing a cantilever-type piezo-resistive micro-accelerometer

机译:应用于制造悬臂式压阻式微加速度计的原始技术

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An original new design for manufacturing a piezo-resistive type micro- accelerometer made by Si bulk micro-machining is proposed. The enhancements applied by the authors especially in design and also in processing and control techniques lead to a more precise device, having a superior reliability. In contrast to classical type, the new model has shorter cantilevers, enabling to obtain an uniform stress and so permitting us a long piezo-resistor design. This in turn enables the use of low surface boron concentration at diffused resistors, resulting in a low temperature drift. In order to cut mask fabrication costs, a new approach, based on photoplot-type reticules, is applied, too. After ANSIS simulation, showing the benefits of this new design, it follows the description of layout-based surface and volume control elements, and finally the processing enhancements applied to give a 1g piezo-resistive accelerometer
机译:提出了一种通过硅体微加工制造压阻式微加速度计的新颖设计。作者特别是在设计以及处理和控制技术方面所应用的增强功能导致了具有更高可靠性的更精确的设备。与传统类型相反,新模型具有较短的悬臂,能够获得均匀的应力,因此允许我们使用较长的压电电阻器设计。这继而使得能够在扩散电阻器上使用低表面硼浓度,从而导致较低的温度漂移。为了减少掩模的制造成本,也采用了基于光绘型标线的新方法。经过ANSIS仿真后,展示了此新设计的优势,它遵循了基于布局的表面和体积控制元素的说明,最后对工艺进行了改进,以提供1g压阻式加速度计

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