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GaN homojunction and AlGaN/GaN heterojunction visible-blind photodiodes grown on SiC

机译:在SiC上生长的GaN同质结和AlGaN / GaN异质结可见盲光电二极管

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Abstract: GaN homojunction and AlGaN/GaN heterojunction UV photodiodes were successfully fabricated and tested. The p$+$PLU$/ mesa devices were grown on a n-type 6H-SiC substrate. Photoresponse was observed in these deices from 206 nm to the cutoff wavelength of GaN. Peak responsivity values of 111 mA/W and 123 mA/W were observed at 360 nm for unpackaged homojunction and heterojunction devices, respectively. In packaged device, the peak responsivity increased to 124 and 147 mA/W for the homojunction and heterojunction devices, respectively. High breakdown voltages in excess of 100 V for the homojunction and 70 V for the heterojunction devices were obtained with dark current densities of 3 by 10$+$MIN@11$/ A/cm$+2$/ and 1 by 10$+$MIN@10$/ A/cm$+2$/ A/cm$+2$/ at $MIN@1V bias at room temperature, respectively. These result show that homojunction and heterojunction visible-blind detectors can be fabricated in the AlGaN/GaN material system on SiC substrates. !8
机译:摘要:成功地制备并测试了GaN同质结和AlGaN / GaN异质结紫外光电二极管。 p $ + $ PLU $ // n台面器件在n型6H-SiC衬底上生长。在这些器件中观察到从206 nm到GaN截止波长的光响应。对于未封装的同质结和异质结器件,在360 nm处观察到的峰值响应值为111 mA / W和123 mA / W。在封装器件中,同质结和异质结器件的峰值响应率分别提高到124和147 mA / W。对于同质结,异质结器件的击穿电压超过100 V,对于异质结器件,击穿电压达到70 V,暗电流密度分别为3×10 $ + MIN @ 11 $ / A / cm $ + 2 $ /和1×10 $ +在室温下,在MIN @ 1V偏置下分别为$ MIN @ 10 $ / A / cm $ + 2 $ / A / cm $ + 2 $ /这些结果表明,可以在SiC衬底上的AlGaN / GaN材料系统中制造同质结和异质结可见盲检测器。 !8

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