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Interface Strength of Low-dimensional Nano-Components

机译:低维纳米组分的界面强度

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摘要

The interface strength of low-dimensional nano-components such as films and islands formed on substrates has been investigated in this project, and the focus is put on the mechanics of crack initiation from the free interface edge and propagation along the interface. The series of experiments elucidates the applicability of fracture mechanics concept on the structures. We proposed experimental methods for evaluating the initiation strength of an interface crack in submicron films and islands deposited on substrates. The initiation is governed by the singular stress field, and the criterion is prescribed by the stress intensity parameter. Using special loading apparatus built in a TEM, we developed a crack initiation method for nano-components and the role of plasticity on the delamination is clarified. Subcritical crack growth along an interface between submicron films under fatigue was also investigated by modified four-point bend method.
机译:在该项目中,研究了低维纳米组分(如薄膜和形成在基材上的岛状物)的界面强度,并将重点放在了从自由界面边缘引发裂纹并沿界面传播的机理上。该系列实验阐明了断裂力学概念在结构上的适用性。我们提出了用于评估亚微米薄膜和沉积在基板上的岛中界面裂纹的起始强度的实验方法。起始由奇异应力场控制,准则由应力强度参数规定。使用内置在TEM中的特殊加载设备,我们开发了一种用于纳米组分的裂纹萌生方法,并阐明了塑性在分层中的作用。还通过改进的四点弯曲方法研究了在疲劳下沿亚微米薄膜之间的界面的亚临界裂纹扩展。

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