首页> 外国专利> A SYSTEM AND METHOD FOR MEASURING THE INTERFACE TENSILE STRENGTH OF PLANAR INTERFACES

A SYSTEM AND METHOD FOR MEASURING THE INTERFACE TENSILE STRENGTH OF PLANAR INTERFACES

机译:测量平面界面的界面张力强度的系统和方法

摘要

A system for measuring the tensile strength of a planar interface between a substrate (30) and a coating (32) which includes an energy source (20) that generates an electromagnetic beam (24) along a first axis, and a sample assembly disposed along the first axis having a first face, and a second face, where the first and second faces are oppositely opposed. The sample assembly includes a confining plate (26), an energy absorbing layer (28), a substrate (30) and a coating (32) having a free surface, all in intimate facing contact with each other, and where the sample (30) and a coating (32) having a free surface, all in intimate facing contact which each other, and where the sample (30) and the coating (32) are in intimate facing contact forms a substrate/coating interface. The coating (32) is positioned along the first axis so that the coating (32) free surface forms the sample assembly second face and the confining plate (26) forms the sample assembly first face.
机译:一种用于测量基板(30)和涂层(32)之间的平面界面的抗拉强度的系统,该系统包括沿第一轴产生电磁束(24)的能量源(20)和沿其布置的样品组件第一轴线具有第一面和第二面,其中第一面和第二面相对。样品组件包括密闭板(26),能量吸收层(28),基底(30)和具有自由表面的涂层(32),所有表面彼此紧密面对接触,并且样品(30) )和具有自由表面的涂层(32),它们彼此紧密面对,并且样品(30)和涂层(32)面对紧密接触,形成基底/涂层界面。涂层(32)沿着第一轴线定位,使得涂层(32)的自由表面形成样品组件的第二面,而限制板(26)形成样品组件的第一面。

著录项

  • 公开/公告号WO9420829A1

    专利类型

  • 公开/公告日1994-09-15

    原文格式PDF

  • 申请/专利权人 THE TRUSTEES OF DARTMOUTH COLLEGE;

    申请/专利号WO1994US02268

  • 发明设计人 GUPTA VIJAY;

    申请日1994-03-02

  • 分类号G01L1/24;

  • 国家 WO

  • 入库时间 2022-08-22 04:40:36

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