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SiC MOSFETs as Enabler for the future ePowertrain and its behaviour under Short Circuit Condition

机译:SiC MOSFET作为未来ePowertrain的推动者及其在短路条件下的性能

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Silicon Carbide (SiC) components have been used for a number of years in industrial applications and now are progressively entering the automotive segment. The first devices of this wide-bandgap material to be used in vehicle applications were SiC diodes in on-board charger (OBC) applications. The excellent SiC diode switching performance is ideal for the freewheeling path in the power factor correction stages. The market for automotive grade SiC components is showing impressive growth aligned to the rise in electric vehicles with SiC MOSFETs being used in traction inverters as well as OBC or DC-DC converter applications. This paper explains the significant advantages that wide-bandgap technologies have compared to well establish Si technologies. This applies especially for the total cost of ownership approach, not considering the single device only but the complete application or interaction between different components. When a new semiconductor material is introduced into the automotive sector, the stringent qualification requirements mean that a special focus is needed on the manufacturing strategy. This paper also describes a manufacturing strategy designed to serve the automotive market, the key reliability factors and how improvements have been achieved. As power density of the new technology compared with Si devices is strongly increasing, simulation approaches have been introduced to characterize MOSFETs under short circuit condition to ex-plain the failure mechanism under such harsh applications conditions.
机译:碳化硅(SiC)组件已经在工业应用中使用了很多年,现在正逐步进入汽车领域。这种用于汽车应用的宽带隙材料的首批器件是车载充电器(OBC)应用中的SiC二极管。出色的SiC二极管开关性能非常适合功率因数校正级中的续流路径。随着牵引逆变器以及OBC或DC-DC转换器应用中使用SiC MOSFET的出现,与电动汽车的增长一致,汽车级SiC组件市场呈现出令人瞩目的增长。本文解释了宽带隙技术与完善的硅技术相比具有的显着优势。这尤其适用于总拥有成本方法,而不是仅考虑单个设备,而是考虑完整的应用程序或不同组件之间的交互。当一种新的半导体材料被引入汽车领域时,严格的资格要求意味着需要特别关注制造策略。本文还描述了旨在服务于汽车市场的制造策略,关键的可靠性因素以及如何实现改进。随着新技术与硅器件相比功率密度的不断提高,已引入了仿真方法来表征短路条件下的MOSFET,以阐明这种苛刻应用条件下的故障机理。

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