首页> 外文会议>33rd European Solid-State Device Research Conference (ESSDERC 2003); Sep 16-18, 2003; Estoril, Portugal >The Influence of Parasitic Resistances on the f_T-Optimisation of High-Speed SiGe-HBTs
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The Influence of Parasitic Resistances on the f_T-Optimisation of High-Speed SiGe-HBTs

机译:寄生电阻对高速SiGe-HBT的f_T优化的影响

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We study the influence of parasitic series resistances on the cut-off frequency of high-speed SiGe hetero-junction bipolar transistors. Due to coupling of the parasitic resistances with the internal collector-base capacitance significant extra delay time is introduced. This extra delay will cause saturation, or even a decrease, of f_T at higher collector doping levels. In addition, we study the optimisation of an n-cap emitter profile, which is only possible when the collector delay is reduced to a minimum, and the series resistances are properly included.
机译:我们研究了寄生串联电阻对高速SiGe异质结双极晶体管截止频率的影响。由于寄生电阻与内部集电极-基极电容的耦合,引入了显着的额外延迟时间。在较高的集电极掺杂水平下,这种额外的延迟将导致f_T饱和,甚至降低。此外,我们研究了n电容发射极分布的优化,这只有在将集电极延迟减小到最小并且适当地包含串联电阻时才有可能。

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