OPTOELECTRONIC PHASE DELAY MEASUREMENT FOR A MODIFIED MICHELSON INTERFEROMETER

摘要

For the primary calibration of the phase response of accelerometers, the knowledge of the response delay of the reference, i.e. the laser interferometer is a decisive prerequisite. However, an experimental determination of the interferometric response time is not a simple task. This contribution describes an opto-electronic set-up based on a femtosecond laser and originally developed for calibration of high speed sampling oscilloscopes, which enables a precise determination of the intrinsic delay of the photo detectors of a modified Michelson interferometer used at PTB.