首页> 外文会议>2016 IEEE 37th International Electronics Manufacturing Technology amp; 18th Electronics Materials and Packaging Conference >Palladium coated copper wire wedge integrity to withstand extended high temperature storage stress test
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Palladium coated copper wire wedge integrity to withstand extended high temperature storage stress test

机译:镀钯铜线楔形完整性,可承受扩展的高温存储应力测试

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Copper (Cu) wire bonding technology had been widely accepted as a interconnect material in semiconductor packaging. The main advantage of Cu as a interconnect material is cost, thermal and electrical performance as compare to gold. However effect of corrosive elements on bare Cu wire remain a big challenge for the reliability of Cu wire packages. Market trend is pushing for Palladium coated copper (PCC) wire to be the alternative for bare Cu wire, due to the better bondability process and resistance to corrosive elements. Nevertheless there are many researches suggest PCC wire is not suitable for High Temperature Storage (HTS) reliability stress test more than 150oC due to the intrinsic degradation of PCC wire. From literature review the main contribution to the degration of PCC wire was due to the crack or void on the Palladium (Pd) coating. Cu underneath the Pd coating will diffuse through the crack to the surface and weaken the integrity of the wire. Through sparking parameter optimization, optimal Pd coverage on the FAB can be achieved hence first bond integrity can be secured. On the other hand, 100% Pd coverage on the second bond wedge is impossible to obtain due to the extensive mechanical contact of capillary on the wedge during formation. In this paper, the study will focus on the wedge PCC wire on roughen leadframe with NiPdAuAg surface finishing. The study will cover difference 3 main factors influencing the integrity of wedge, i) wedge formation, ii) leadframe AuAg plating thickness iii) ionic elements from mold compound. Sample with various wedge formation on different AuAg plating thickness with and without mold compound will be subjected to HTS 200oC up to 900 hours and comparison of the degration rate for different samples can be identify. The aim of the study is to identify the dominant factor of the PCC wedge degration on HTS stress so that improvement for package beyond AEC Q100 Grade 0 can be achieved.
机译:铜(Cu)引线键合技术已被广泛接受为半导体封装中的互连材料。与金相比,铜作为互连材料的主要优点是成本,热和电性能。然而,腐蚀元素对裸铜丝的影响仍然是铜丝封装可靠性的一大挑战。由于更好的粘合工艺和耐腐蚀性元素,市场趋势正在推动涂钯铜(PCC)焊丝替代裸铜丝。然而,有许多研究表明,由于PCC导线固有的退化,PCC导线不适合在超过150oC的高温存储(HTS)可靠性应力测试中使用。从文献回顾来看,对PCC钢丝降解的主要贡献是由于钯(Pd)涂层上的裂纹或空隙。 Pd涂层下面的Cu将通过裂纹扩散到表面,并削弱导线的完整性。通过优化火花参数,可以在FAB上实现最佳的Pd覆盖率,因此可以确保第一键的完整性。另一方面,由于在形成过程中毛细管在楔上的广泛机械接触,不可能在第二粘结楔上获得100%的Pd覆盖率。在本文中,研究将集中在具有NiPdAuAg表面精加工的粗糙引线框架上的楔形PCC线。这项研究将涵盖影响楔形完整性的3个主要因素,i)楔形形成,ii)引线框AuAg镀层厚度iii)模塑料中的离子元素。具有和不具有防霉剂的不同AuAg镀层厚度上具有各种楔形的样品将经受900°C的HTS 200oC加热,并且可以确定不同样品的脱胶率比较。该研究的目的是确定PCC楔形变位对HTS应力的主导因素,以便可以实现超过AEC Q100 0级的封装改进。

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