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A reliable 40 GHz opto-electrical system for characterization of frequency response of Ge PIN photo detectors

机译:可靠的40 GHz光电系统,用于表征Ge PIN光电探测器的频率响应

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摘要

A reliable measurement setup was built with VNA principle and properly calibrated for opto-electrical characterization of the in-house fabricated Ge PIN PDs. At a bias of − 1 V the 3-dB BW above 40 GHz for device radius of 5 µm was observed in the wavelength of 1550 nm. The good agreement of the 3-dB BWs between VNA and HET proves the reliability of the investigated measurement setup. The setup was recently employed to characterize novel GeSnPDs [6].
机译:利用VNA原理构建了可靠的测量设置,并对其进行了适当的校准,以对内部制造的Ge PIN PD进行光电表征。在− 1 V的偏压下,在1550 nm的波长下,对于5 µm的设备半径,在40 GHz以上的3 dB BW被观察到。 VNA和HET之间3 dB BW的良好一致性证明了所研究的测量设置的可靠性。该装置最近用于表征新型GeSnPD [6]。

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