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Dose rate radiation induced linear CCD functional failure

机译:剂量率辐射引起的线性CCD功能故障

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摘要

The experiments of different dose rate radiation induced Charge Coupled Devices (CCD) functional failure are presented. The CCDs are divided into three groups with no shielding, shielding the output amplifiers, and shielding the photo sensing and the shift register areas with Pb during 60Co γ tests. The radiation tolerance depend on the dose rates whether the linear CCDs are shielded or not. The total doses to functional failure of the CCDs at different dose rate radiation are compared. The criterion of functional failure induced by ionization radiation is ascertained. The mechanism of CCD functional failure is analyzed.
机译:提出了不同剂量率辐射诱导的电荷耦合器件(CCD)功能失效的实验。在 60 Coγ测试期间,CCD分为三组,无屏蔽,屏蔽输出放大器,并用Pb屏蔽光敏和移位寄存器区域。辐射耐受性取决于剂量率,而无论线性CCD是否被屏蔽。比较了在不同剂量率辐射下CCD功能失效的总剂量。确定了由电离辐射引起的功能故障的标准。分析了CCD功能失效的机理。

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