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Influence of beam conditions and energy for SEE testing

机译:光束条件和能量对SEE测试的影响

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摘要

The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.
机译:研究了重离子测试条件和束能量对设备响应的影响。用两种类型的测试工具可以说明这些影响。 SRAM和功率MOSFET。此外,还执行了GEANT4仿真以更好地了解结果。

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