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INTEGRATED CURRENT DETECTOR FOR HEMT POWER TRANSISTOR in GaN

机译:GaN中HEMT功率晶体管的集成电流检测器

摘要

Current detection device of a power transistor (10), in particular of the GaN HEMT type, said detection device being capable of indicating when the detected current is positive and/or negative and comprising:- a circuit portion ( 20) current-voltage converter provided with a detection node (N1) coupled to said power transistor and configured to produce at said measurement node (N1) a potential (Vsense) for measuring an image of a fraction of said current delivered by said power transistor (10),- a first detection circuit (30) coupled to said detection node (N1), said at least detection circuit (30) with transistor(s) being provided with at least one amplification stage comprising at least one amplification transistor whose gate-source voltage depends on said measurement potential (Vsense), said detection circuit (30, 30', 50, 50', 70) being configured to produce at output a binary detection signal indicating of when said detected current reaches the said first given level of current. Figure for abstract: Figure 1.
机译:功率晶体管(10)的电流检测装置,尤其是GaN HEMT型,所述检测装置能够指示检测到的电流何时为正和/或负,并且包括:-电路部分(20)电流-电压转换器,其配备有耦合到所述功率晶体管的检测节点(N1),并且配置为在所述测量节点(N1)处产生电势(Vsense),用于测量所述功率晶体管输送的所述电流的一部分的图像晶体管(10)——耦合到所述检测节点(N1)的第一检测电路(30),所述至少检测电路(30),所述至少检测电路(30)具有至少一个放大级,所述放大级包括至少一个放大晶体管,其栅极源极电压取决于所述测量电势(Vsense),所述检测电路(30,30',50,50',70)被配置成在输出时产生二进制检测信号,指示所述检测电流何时达到所述第一给定电流水平。摘要图:图1。

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