首页> 外国专利> ANALYSIS DEVICE, ANALYSIS METHOD, PROGRAM FOR ANALYSIS DEVICE, LEARNING DEVICE FOR ANALYSIS, LEARNING METHOD FOR ANALYSIS, AND PROGRAM FOR LEARNING DEVICE FOR ANALYSIS

ANALYSIS DEVICE, ANALYSIS METHOD, PROGRAM FOR ANALYSIS DEVICE, LEARNING DEVICE FOR ANALYSIS, LEARNING METHOD FOR ANALYSIS, AND PROGRAM FOR LEARNING DEVICE FOR ANALYSIS

机译:分析装置,分析方法,分析装置的程序,分析学习装置,分析学习方法,以及用于分析的学习设备的程序

摘要

Provided is an analysis device for analyzing a measurement sample on the basis of spectral data obtained from the measurement sample. The analysis device comprises: a correlation data storage unit for storing correlation data indicating the correlation between spectral data regarding reference samples for which a total analysis value of a predetermined plurality of components is already known and the total analysis values of the reference samples; and a calculation main unit that applies the correlation data to spectral data regarding a measurement sample, and calculates the total analysis value of a predetermined plurality of components included in the measurement sample. The reference samples include a first reference sample including the predetermined plurality of components, and a second reference sample composed of one or more of the components included in the first reference sample. The correlation data indicates a machine learning model calculated using teacher data, namely, first reference sample data including the spectral data regarding the first reference sample and the total analysis value of the predetermined plurality of components included in the first reference sample, and second reference sample data including the spectral data regarding the second reference sample and the total analysis value of the predetermined plurality of components included in the second reference sample.
机译:提供了一种用于基于从测量样本获得的光谱数据分析测量样本的分析装置。分析装置包括:相关数据存储单元,用于存储指示关于关于参考样本的频谱数据之间的相关性的相关数据,其中已经已知预定的多个组分的总分析值以及参考样品的总分析值;和一个计算主单元,其将相关数据应用于关于测量样本的光谱数据,并计算包括在测量样本中的预定多个组件的总分析值。参考样品包括第一参考样品,包括预定的多个组分,以及由包括在第一参考样品中的一个或多个组分组成的第二参考样品。相关数据指示使用教师数据计算的机器学习模型,即,第一参考样本数据包括关于第一参考样本的光谱数据和第一参考样本中包括的预定多个组件的总分析值和第二参考样本包括关于第二参考样本的光谱数据和包括在第二参考样本中的预定多个组件的频谱数据。

著录项

  • 公开/公告号WO2022014126A1

    专利类型

  • 公开/公告日2022-01-20

    原文格式PDF

  • 申请/专利权人 HORIBA LTD.;

    申请/专利号WO2021JP17666

  • 发明设计人 YABUSHITA HIROTAKA;NAGAOKA MAKOTO;

    申请日2021-05-10

  • 分类号G01N21/3504;

  • 国家 JP

  • 入库时间 2022-08-24 23:29:49

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