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MEMORY DEVICE AND METHOD FOR MONITORING THE PERFORMANCES OF A MEMORY DEVICE

机译:用于监视存储器设备的性能的存储器设备和方法

摘要

The present disclosure relates to method for checking the reading phase of a non-volatile memory device including at least an array of memory cells and with associated decoding and sensing circuitry and a memory controller, the method comprises:storing in a dummy row associated to said memory block at least internal block variables and a known pattern;performing a reading of said dummy row;comparing a result of the reading with the known pattern;trimming the parameters of the reading and/or swapping the used memory block based on the result of the comparing.
机译:本公开涉及用于检查非易失性存储器件的读取阶段的方法,包括存储器单元的至少一系列存储器单元和相关联的解码和感测电路和存储器控制器,该方法包括:存储在与所述相关联的凹陷行中 内存块至少内部块变量和已知的模式;执行所述凹陷的读取;比较读取的读取结果与已知模式;修剪读取的参数和/或根据所结果转换使用的存储块 比较。

著录项

  • 公开/公告号US2021405910A1

    专利类型

  • 公开/公告日2021-12-30

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201916624512

  • 发明设计人 ALBERTO TROIA;ANTONINO MONDELLO;

    申请日2019-05-31

  • 分类号G06F3/06;

  • 国家 US

  • 入库时间 2022-08-24 23:07:37

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