Particle imager, particle size measuring device, compound particle size measuring device, computer program, particle observation method, and compound particle measuring device

摘要

Provided is a particle imaging device or the like capable of acquiring an image for measuring a particle size and an image for classifying particles in a single imaging. The particle imaging device irradiates a sample in which particles are dispersed in a dispersion medium with first light having a wavelength of the first wavelength and second light including light having a wavelength of the second wavelength from different directions. The first unit includes an irradiation unit, an imaging unit that images the particles illuminated by the first light and the second light, and an output unit that outputs an image captured to calculate the particle size distribution. The light emitting surface of 1 is provided at a position facing the imaging unit with the sample in between, and the second light emitting surface is said from the same side as the imaging unit with the sample as a reference. It is provided at a position to illuminate the sample.