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SYSTEMS AND METHODS FOR ANALYZING WORKSPACE CLUTTER AND GENERATING IMPROVED WORKSPACE LAYOUTS

机译:用于分析工作区杂波的系统和方法,并生成改进的工作区布局

摘要

A system for evaluating a workspace surface having one or more objects placed thereon is disclosed. The system may include sensors configured to capture data corresponding to the workspace surface and a controller communicatively coupled to the sensors. The controller may generate an illuminance map of the workspace surface based on the captured data. The controller may generate a clutter entropy level based on the illuminance map and an entropy assessor. The controller may determine whether the clutter entropy level exceeds a clutter threshold. The controller may provide a clutter indication to a user device if the clutter entropy level exceeds the clutter threshold. The controller may identify the objects placed on the workspace surface. The controller may generate a decluttered layout based on the one or more objects and a layout generator.
机译:公开了一种用于评估具有放置其上的一个或多个物体的工作区表面的系统。 该系统可以包括传感器,该传感器被配置为捕获与工作空间表面相对应的数据和通信地耦合到传感器的控制器。 控制器可以基于捕获的数据生成工作区表面的照度映射。 控制器可以基于照度图和熵评估仪产生杂波熵电平。 控制器可以确定杂波熵电平是否超过杂波阈值。 如果杂波熵级别超过杂波阈值,则控制器可以向用户设备提供杂波指示。 控制器可以识别放置在工作区表面上的物体。 控制器可以基于一个或多个对象和布局发生器生成倾斜布局。

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