首页> 外国专利> METHOD FOR DETERMINING CLEANLINESS OF CLEANING MEMBER, METHOD FOR DETERMINING ADSORPTION CHARACTERISTICS OF CONTAMINANTS THAT CONTAMINATE CLEANING MEMBER, METHOD FOR DETERMINING CLEANLINESS OF SUBSTRATE, PROGRAM FOR DETERMINING CLEANLINESS OF SUBSTRATE, AND PROGRAM FOR DETERMINING END POINT OF CLEANING PROCESS

METHOD FOR DETERMINING CLEANLINESS OF CLEANING MEMBER, METHOD FOR DETERMINING ADSORPTION CHARACTERISTICS OF CONTAMINANTS THAT CONTAMINATE CLEANING MEMBER, METHOD FOR DETERMINING CLEANLINESS OF SUBSTRATE, PROGRAM FOR DETERMINING CLEANLINESS OF SUBSTRATE, AND PROGRAM FOR DETERMINING END POINT OF CLEANING PROCESS

机译:确定清洁构件清洁性的方法,确定污染物的吸附特性的方法,污染物清洁构件的吸附特性,用于确定基板清洁度的方法,用于确定基板清洁度的程序,以及确定清洁过程结束点的程序

摘要

In a method for determining cleanliness of a cleaning member that contacts a substrate and with which scrub cleaning is performed, the method includes a first step of self-cleaning a cleaning member by releasing contaminants from the cleaning member into a cleaning liquid, and a second step of bringing a self-cleaning discharged liquid into contact with an electrode of a crystal oscillator, attaching the contaminants contained in the discharged liquid onto the electrode of the crystal oscillator, then measuring a frequency response of the crystal oscillator in which the contaminants are attached onto the electrode, and determining cleanliness of the cleaning member based on the measured frequency response.
机译:在用于确定接触基板的清洁构件的清洁性的方法中,并且在进行擦洗清洁的情况下,该方法包括通过将来自清洁构件的污染物释放到清洁液中的污染物和第二个方法的第一步骤。 将自清洁排出的液体与晶体振荡器的电极接触的步骤,将包含在排出的液体中的污染物附着到晶体振荡器的电极上,然后测量附着污染物的晶体振荡器的频率响应 在电极上,基于测量的频率响应确定清洁部件的清洁度。

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