首页> 外国专利> Reliability sampling plan cost-effectiveness optimization design method based on prediction result of failure rate of electronic equipment applied to weapon system

Reliability sampling plan cost-effectiveness optimization design method based on prediction result of failure rate of electronic equipment applied to weapon system

机译:可靠性采样规划成本效益优化设计方法基于武器系统的电子设备故障率预测结果

摘要

This application is based on the failure rate calculated based on the failure rate prediction model of the electronic equipment applied to the weapon system and optimizes the correlation between the number of sampling samples and the cost caused by the test time variable according to the number of samples to show the effectiveness of the sampling cost vs. reliability. An optimal design method is provided.
机译:本申请基于基于应用于武器系统的电子设备的故障速率预测模型计算的故障率,并根据样品数量优化采样样本数量的相关性和由测试时间变量引起的成本之间的相关性 显示采样成本与可靠性的有效性。 提供了一种最佳设计方法。

著录项

  • 公开/公告号KR102335651B1

    专利类型

  • 公开/公告日2021-12-06

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR1020200169581

  • 发明设计人 김장은;

    申请日2020-12-07

  • 分类号G06F30/20;G06F119/02;

  • 国家 KR

  • 入库时间 2022-08-24 22:38:00

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