首页> 外国专利> DETERMINATION METHOD AND APPARATUS, PROGRAM, INFORMATION RECORDING MEDIUM, EXPOSURE APPARATUS, LAYOUT INFORMATION PROVIDING METHOD, LAYOUT METHOD, MARK DETECTION METHOD, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD

DETERMINATION METHOD AND APPARATUS, PROGRAM, INFORMATION RECORDING MEDIUM, EXPOSURE APPARATUS, LAYOUT INFORMATION PROVIDING METHOD, LAYOUT METHOD, MARK DETECTION METHOD, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD

机译:确定方法和装置,程序,信息记录介质,曝光装置,布局信息提供方法,布局方法,标记检测方法,曝光方法和设备制造方法

摘要

A determination apparatus has a calculation section, where first and second direction pitches intersecting within a predetermined plane of a plurality of detection areas are D1 and D2, respectively, sizes in the first and second directions of each of a plurality of divided areas arranged two-dimensionally along the first and second directions on a substrate are W1 and W2, respectively, and first and second direction pitches of a plurality of marks arranged on the substrate are p1 and p2, respectively, calculates pitch p1 and pitch p2 of the plurality of marks that satisfy formulas (a) and (b) below, based on pitch D1, pitch D2, size W1, and size W2.; p 1 =D 1 /i (i denotes a natural number)=W1/m (m denotes a natural number)   (a); p 2 =D 2 /j (j denotes a natural number)=W2/n (n denotes a natural number)   (b)
机译:确定装置具有计算部分,其中分别在多个检测区域的预定平面内交叉的第一和第二方向间距分别是D1和D2,在布置两个的多个划分区域中的每一个的第一和第二方向上尺寸 沿着基板上的第一和第二方向沿第一和第二方向分别是W1和W2,并且分别布置在基板上的多个标记的第一和第二方向间距分别是P1和P2,计算多个标记的间距P1和间距P2 满足下面的公式(A)和(B),基于间距D1,俯仰D2,尺寸W1和尺寸W2; p 1 = d 1 / i(i表示自然数)= w1 / m(m表示自然数)(a); p 2 = d 2 / j(j表示自然数)= w2 / n(n表示自然数)(b)

著录项

  • 公开/公告号US2021313278A1

    专利类型

  • 公开/公告日2021-10-07

    原文格式PDF

  • 申请/专利权人 NIKON CORPORATION;

    申请/专利号US202117354016

  • 发明设计人 YUICHI SHIBAZAKI;

    申请日2021-06-22

  • 分类号H01L23/544;H01L21/68;G03F7/22;G03F7/20;

  • 国家 US

  • 入库时间 2022-08-24 21:29:57

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