首页> 外国专利> Method for detecting abnormality of film of enameled wire, manufacturing method of enamel wire, and manufacturing apparatus of enamel wire.

Method for detecting abnormality of film of enameled wire, manufacturing method of enamel wire, and manufacturing apparatus of enamel wire.

机译:检测搪瓷线薄膜异常的方法,搪瓷线制造方法和搪瓷线的制造装置。

摘要

To provide an enamel wire coating abnormality detection method, an enamel wire manufacturing method and an enamel wire manufacturing device with which it is possible to detect coating abnormality even when thickness abnormality occurring to an enamel coating is lower than a prescribed height.SOLUTION: Provided is an enamel wire coating abnormality detection method for detecting the abnormality of enamel coating. The enamel wire coating abnormality detection method includes the steps of: acquiring the surface height of enamel coating of an enamel wire; acquiring a surface image of the enamel coating; detecting the surface shape of coating of the enamel wire from the acquired surface image of the enamel wire coating; outputting an abnormal height signal when the acquired surface height of the enamel coating exceeds a prescribed height; outputting an abnormal shape signal when the area calculated from the detected surface shape of the enamel coating exceeds a prescribed area; and determining that there is abnormality of the enamel coating when the abnormal height signal or the abnormal shape signal is outputted.SELECTED DRAWING: Figure 1
机译:为了提供搪瓷线涂层异常检测方法,即使当牙釉质涂层的厚度异常低于规定的高度时,也可以检测涂层异常的搪瓷线制造方法和搪瓷线制造装置。概率:提供:提供一种检测搪瓷涂层异常的牙釉质丝涂层异常检测方法。搪瓷线涂层异常检测方法包括以下步骤:获取搪瓷线的搪瓷涂层的表面高度;获取搪瓷涂层的表面图像;从搪瓷线涂层的所获取的表面图像检测搪瓷线涂层的表面形状;当搪瓷涂层的所获取的表面高度超过规定的高度时输出异常高度信号;当从检测到的搪瓷涂层的表面形状计算的区域超过规定区域时输出异常形状信号;当输出异常高度信号或异常形状信号时,确定牙釉质涂层异常。选择绘图:图1

著录项

  • 公开/公告号JP6922772B2

    专利类型

  • 公开/公告日2021-08-18

    原文格式PDF

  • 申请/专利权人 日立金属株式会社;

    申请/专利号JP20180023589

  • 发明设计人 佐藤 巧;大築 優;

    申请日2018-02-13

  • 分类号G01N21/892;H01B13/16;G01B11/30;G01B11;G01R31/50;H01B13;

  • 国家 JP

  • 入库时间 2022-08-24 20:38:28

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